Metal-organic framework-based nanomaterials as opto-electrochemical sensors for the detection of antibiotics and hormones: A review

• Akeem Adeyemi Oladipo,
• Saba Derakhshan Oskouei and
• Mustafa Gazi

Beilstein J. Nanotechnol. 2023, 14, 631–673, doi:10.3762/bjnano.14.52

• biomolecules via electrostatic forces, stacking, and/or hydrogen bonding, which lead to high accumulation of the target analyte, are another factor that supports the development of electrochemical sensors. However, because of the high proportion of organic ligands, most MOFs have poor electrical conductivity

High–low Kelvin probe force spectroscopy for measuring the interface state density

• Ryo Izumi,
• Masato Miyazaki,
• Yan Jun Li and
• Yasuhiro Sugawara

Beilstein J. Nanotechnol. 2023, 14, 175–189, doi:10.3762/bjnano.14.18

• interface state density inside semiconductors. We derive an analytical expression for the electrostatic forces between a tip and a semiconductor sample in the accumulation, depletion, and inversion regions, taking into account the charge transfer between the bulk and interface states in semiconductors. We

• show that the analysis of electrostatic forces in the depletion region at high- and low-frequency AC bias voltages provides information about the interface state density in the semiconductor bandgap. As a preliminary experiment, high-low KPFS measurements were performed on ion-implanted silicon

• interface state density in the semiconductor bandgap. We also demonstrate using a pn-patterned silicon substrate that the interface state density can be measured. Theory To understand the principle of the high–low KPFS proposed in this study, we discuss the electrostatic forces acting between the tip and

A cantilever-based, ultrahigh-vacuum, low-temperature scanning probe instrument for multidimensional scanning force microscopy

• Hao Liu,
• Zuned Ahmed,
• Sasa Vranjkovic,
• Manfred Parschau,
• Andrada-Oana Mandru and
• Hans J. Hug

Beilstein J. Nanotechnol. 2022, 13, 1120–1140, doi:10.3762/bjnano.13.95

• acquisition of overview images at larger tip–sample distances. Our instrument is thus well-suited to find specific locations in devices, map weak magnetic or electrostatic forces, and also permits the acquisition of smaller scan range atomic resolution images at specific locations. This manuscript is

Comparing the performance of single and multifrequency Kelvin probe force microscopy techniques in air and water

• Jason I. Kilpatrick,
• Emrullah Kargin and
• Brian J. Rodriguez

Beilstein J. Nanotechnol. 2022, 13, 922–943, doi:10.3762/bjnano.13.82

• ]. The regulation of tip–sample distance in KPFM imaging is generally performed by employing a feedback loop that maintains the mechanical oscillation amplitude of the cantilever at the fundamental eigenmode, ω1, at a fixed value. This precludes simultaneous measurement of electrostatic forces on this

• excitation applied at ω1 as it traces the topography measured in the first pass at a specific lift height above the surface. Lift height can be set such that the electrostatic forces are isolated from stronger short range forces at the expense of spatial resolution [10][58]. By setting the lift height to

• . These mixing products have enhanced sensitivity to electrostatic forces at the expense of localization to small tip–sample separations. By choosing ωe such that the mixing products fall on the sidebands of ω1, the SNR is improved whilst enabling single-pass scanning. There are trade-offs here in that ωe

Direct measurement of surface photovoltage by AC bias Kelvin probe force microscopy

• Masato Miyazaki,
• Yasuhiro Sugawara and
• Yan Jun Li

Beilstein J. Nanotechnol. 2022, 13, 712–720, doi:10.3762/bjnano.13.63

• experiments using AC-KPFM in the FM mode. Theory of AC-KPFM for SPV Measurements General concept KPFM measures the CPD by compensating the electrostatic forces between the tip and the sample. When an AC bias VAC·cos(ωmt) with modulation frequency ωm between the tip and the sample is applied, the electrostatic

A comprehensive review on electrospun nanohybrid membranes for wastewater treatment

• Senuri Kumarage,
• Imalka Munaweera and
• Nilwala Kottegoda

Beilstein J. Nanotechnol. 2022, 13, 137–159, doi:10.3762/bjnano.13.10

• , and phase inversion [1] to fabricate porous nanomembranes, electrospinning is a straightforward emerging technology that uses electrostatic forces to produce ultrathin fibers with diameters at the nanometer scale. In comparison to the membranes developed via other methodologies, electrospinning

• dominant. When the voltage is high enough for the electrostatic forces of the Taylor cone to overcome the surface tension and viscous force, jet initiation happens, and a polymer jet will reach the ground collector completing the circuit. Polymers with high molecular weight will form ultrafine fibers due

• cone, the polymer jet initiation happens when the voltage reaches a threshold value at which the electrostatic forces overcome the surface tension of the polymer droplet. The increase of the applied voltage up to a particular value decreases the fiber diameter [21]. Huan et al. reported that at low

Self-assembly of amino acids toward functional biomaterials

• Huan Ren,
• Lifang Wu,
• Lina Tan,
• Yanni Bao,
• Yuchen Ma,
• Yong Jin and
• Qianli Zou

Beilstein J. Nanotechnol. 2021, 12, 1140–1150, doi:10.3762/bjnano.12.85

• -ordered structures from a complex mixture via noncovalent interactions, including van der Waals forces, electrostatic forces, hydrogen bonds, and stacking interactions [12][13]. Importantly, biomolecules, such as proteins, peptides, or biologically derived molecules, including de novo designed peptides or

• and molecular forces play a key role in self-assembly, including hydrogen bonds, hydrophobic bonds, van der Waals force, ionic bonds, π–π stacking, and electrostatic forces [31]. Importantly, amino acids are simple building blocks that provide relevant noncovalent interactions to construct complex

Fate and transformation of silver nanoparticles in different biological conditions

• Barbara Pem,
• Marija Ćurlin,
• Darija Domazet Jurašin,
• Valerije Vrček,
• Rinea Barbir,
• Vedran Micek,
• Raluca M. Fratila,
• Jesus M. de la Fuente and
• Ivana Vinković Vrček

Beilstein J. Nanotechnol. 2021, 12, 665–679, doi:10.3762/bjnano.12.53

• such conditions, the repulsive electrostatic forces between particles with the same surface charge are weakened, leading to aggregation upon collision [10]. The AgNPs with bulky coatings are less sensitive to this, since their stabilisation is steric and not electrostatic [14]. The dissolution of AgNPs

Colloidal particle aggregation: mechanism of assembly studied via constructal theory modeling

• Scott C. Bukosky,
• Sukrith Dev,
• Monica S. Allen and
• Jeffery W. Allen

Beilstein J. Nanotechnol. 2021, 12, 413–423, doi:10.3762/bjnano.12.33

• -cleaning devices [12]. It was concluded that the maximum collection rate was achieved when the aerosol particles first formed into clusters and then dendrites in order to balance their electrostatic forces. The aggregation of colloidal particles (small particles or droplets typically between 10 nm and 10

Fusion of purple membranes triggered by immobilization on carbon nanomembranes

• René Riedel,
• Natalie Frese,
• Fang Yang,
• Martin Wortmann,
• Raphael Dalpke,
• Daniel Rhinow,
• Norbert Hampp and
• Armin Gölzhäuser

Beilstein J. Nanotechnol. 2021, 12, 93–101, doi:10.3762/bjnano.12.8

• topography data from the first scan. The voltage applied to the tip to compensate for attracting/repelling electrostatic forces indicates the electrostatic potential of the sample. The samples were further analyzed by SEM in a Zeiss Auriga (Carl Zeiss, Jena, Germany) at an acceleration voltage of 5 kV using

Bulk chemical composition contrast from attractive forces in AFM force spectroscopy

• Dorothee Silbernagl,
• Media Ghasem Zadeh Khorasani,
• Natalia Cano Murillo,
• Anna Maria Elert and
• Heinz Sturm

Beilstein J. Nanotechnol. 2021, 12, 58–71, doi:10.3762/bjnano.12.5

• to a decrease in the lateral resolution compared to other AFM methods, such as tapping [28]. ncAFM is a more universal applicable method since it is carried out over the whole regime of attractive forces: It is sensitive to electrostatic forces (long range, >30 nm), van der Waals forces (intermediate

• FvdW, in general, distinguishable from short-ranged chemical forces and long-ranged electrostatic forces and also dominant in an AFM setup under ambient conditions. But how is this property specific for different materials? In simplified terms, oscillating dipoles emit electromagnetic waves which in

Vibration analysis and pull-in instability behavior in a multiwalled piezoelectric nanosensor with fluid flow conveyance

• Sayyid H. Hashemi Kachapi

Beilstein J. Nanotechnol. 2020, 11, 1072–1081, doi:10.3762/bjnano.11.92

• Waals and electrostatic forces. Hamilton’s principle is used to derive the governing and boundary conditions and is also the assumed mode method used for changing the partial differential equations into ordinary differential equations. The influences of the surface/interface effect, such as Lame’s

Measurement of electrostatic tip–sample interactions by time-domain Kelvin probe force microscopy

• Christian Ritz,
• Tino Wagner and
• Andreas Stemmer

Beilstein J. Nanotechnol. 2020, 11, 911–921, doi:10.3762/bjnano.11.76

• Kalman filter; Kelvin probe force microscopy (KFM); time domain; Introduction Electrostatic forces are important interactions in non-contact atomic force microscopy (NC-AFM). They arise from differences in the work function of the tip and the sample, from trapped charges, or from potentials applied to

• to compensate the electrostatic forces [17][18][19]. With a closed KFM loop, these forces are minimized by definition. However, a static contribution, which is defined by remains uncompensated. This component results from the bias modulation itself and influences the topography measurement. The

• performed on Δftopo, where all electrostatic forces are compensated, including the static contribution . So far, recovering and fitting the Kelvin parabola is known as an open-loop technique, the so-called Kelvin probe force spectroscopy [22][23][24][25]. A real-time closed-loop technique has not been

Quantitative determination of the interaction potential between two surfaces using frequency-modulated atomic force microscopy

• Nicholas Chan,
• Carrie Lin,
• Tevis Jacobs,
• Robert W. Carpick and
• Philip Egberts

Beilstein J. Nanotechnol. 2020, 11, 729–739, doi:10.3762/bjnano.11.60

• to confirm that the force conversion is not ill-posed. Third, static compensation of electrostatic forces was performed to account for surface potential differences between the tip and the sample surface. However, several studies have shown that there is a z-dependency of the required electrostatic

Multilayer capsules made of weak polyelectrolytes: a review on the preparation, functionalization and applications in drug delivery

• Varsha Sharma and
• Anandhakumar Sundaramurthy

Beilstein J. Nanotechnol. 2020, 11, 508–532, doi:10.3762/bjnano.11.41

Implementation of data-cube pump–probe KPFM on organic solar cells

• Benjamin Grévin,
• Olivier Bardagot and
• Renaud Demadrille

Beilstein J. Nanotechnol. 2020, 11, 323–337, doi:10.3762/bjnano.11.24

• it offers the possibility to probe directly and independently both the photocharging rate and the SPV decay. As introduced by Murawski et al. [22], in pp-KPFM the modulated bias voltage, which is used for the detection of electrostatic forces with a lock-in amplifier (LIA), is restricted to a finite

• describe the general setup that has been used to implement data-cube pump–probe-KPFM (Figure 1b and Figure 1c). Additional technical information is provided in the experimental section. We kept the standard SPM controller configuration for frequency-modulation KPFM (FM-KPFM). Here, the electrostatic forces

• mind that the multiplication by the pump train pulses is applied to the sum of Vmod and VKPFM. As a result, the electrostatic forces are not compensated during the time interval between the probe pulses, and the z-feedback can be affected by the time-variable electrostatic force field. To minimize

Internalization mechanisms of cell-penetrating peptides

• Ivana Ruseska and
• Andreas Zimmer

Beilstein J. Nanotechnol. 2020, 11, 101–123, doi:10.3762/bjnano.11.10

• which the initial step toward CPPs’ uptake is the interaction with cell surface proteoglycans, via electrostatic forces. Additionally, interactions with several membrane proteins have been described as well [7]. The following parts will focus on the major internalization paths CPPs exploit, as well as

Imaging the surface potential at the steps on the rutile TiO₂(110) surface by Kelvin probe force microscopy

• Masato Miyazaki,
• Huan Fei Wen,
• Quanzhen Zhang,
• Yuuki Adachi,
• Jan Brndiar,
• Ivan Štich,
• Yan Jun Li and
• Yasuhiro Sugawara

Beilstein J. Nanotechnol. 2019, 10, 1228–1236, doi:10.3762/bjnano.10.122

• distance. The long-range contribution (ΔfLR), van der Waals or electrostatic forces, to the Δf curve was fitted to the inverse power law z−n [52]. By subtracting the ΔfLR curve from the Δf curve, we obtained the short-range contribution (ΔfSR). Finally, the ΔfSR curve was converted to the short-range force

• result, the topography at the step edges at VDC = 0 V was not corrupted by the influence of the electrostatic forces because of the CPD difference on terrace and step. From Figure 2f, we found that the CPD on the terrace has a similar dependence on the tip–sample distance as on the steps when measured on

Influence of dielectric layer thickness and roughness on topographic effects in magnetic force microscopy

• Alexander Krivcov,
• Jasmin Ehrler,
• Marc Fuhrmann,
• Tanja Junkers and
• Hildegard Möbius

Beilstein J. Nanotechnol. 2019, 10, 1056–1064, doi:10.3762/bjnano.10.106

• overlapped by additional forces acting on the tip such as electrostatic forces. In this work the possibility to reduce capacitive coupling effects between tip and substrate is discussed in relation to the thickness of a dielectric layer introduced in the system. Single superparamagnetic iron oxide

• from different forces. Therefore, the quantitative analysis of magnetic properties is still an issue especially because of contributions from electrostatic forces leading to topographic features in the MFM phase images [7][9][10][11][12][13][14]. Yu et al. [9] explained the topographic artifacts by

• between tip and substrate [14]. The increase of the tip–substrate distance in the interleave mode above the nanoparticle leads to a reduction of the electrostatic forces resulting in a positive phase shift. Furthermore methods to reduce the capacitive coupling were discussed, e.g., measurements on

Electrostatic force microscopy for the accurate characterization of interphases in nanocomposites

• Diana El Khoury,
• Richard Arinero,
• Jean-Charles Laurentie,
• Mikhaël Bechelany,
• Michel Ramonda and
• Jérôme Castellon

Beilstein J. Nanotechnol. 2018, 9, 2999–3012, doi:10.3762/bjnano.9.279

• conditions are fulfilled by electrostatic force microscopy (EFM) [18][19]. EFM is an atomic force microscopy (AFM)-based electrostatic method in which a conductive tip and a metallic sample holder are used. The probe-to-stage system is electrically polarized for the detection of electrostatic forces or force

• that scatters the electric field, and the long range nature of the electrostatic forces that complicate the identification of the actual probed region. Therefore, the objectives of this study were to determine whether EFM can identify an interface region, and most importantly, to identify the

Investigation of CVD graphene as-grown on Cu foil using simultaneous scanning tunneling/atomic force microscopy

• Majid Fazeli Jadidi,
• Umut Kamber,
• Oğuzhan Gürlü and
• H. Özgür Özer

Beilstein J. Nanotechnol. 2018, 9, 2953–2959, doi:10.3762/bjnano.9.274

• explicable with the additional effect of electrostatic forces in the experiments. The sample bias voltage values used in the experiments (up to 500 mV) would result in considerable electrostatic force between the tip and the sample. Also, tips with relatively large cone angles would result in van der Waals

In situ characterization of nanoscale contaminations adsorbed in air using atomic force microscopy

• Jesús S. Lacasa,
• Lisa Almonte and
• Jaime Colchero

Beilstein J. Nanotechnol. 2018, 9, 2925–2935, doi:10.3762/bjnano.9.271

• to access the state of contamination of real surfaces under ambient conditions using advanced atomic force microscopy techniques. Keywords: atomic force microscopy; cantilever; contact potential; electrostatic forces; force spectroscopy; Hamaker constant; Kelvin probe microscopy; surface

Intrinsic ultrasmall nanoscale silicon turns n-/p-type with SiO₂/Si₃N₄-coating

• Dirk König,
• Daniel Hiller,
• Noël Wilck,
• Birger Berghoff,
• Merlin Müller,
• Sangeeta Thakur,
• Giovanni Di Santo,
• Luca Petaccia,
• Joachim Mayer,
• Sean Smith and
• Joachim Knoch

Beilstein J. Nanotechnol. 2018, 9, 2255–2264, doi:10.3762/bjnano.9.210

• (ρMO = 1 × 10−3 states/a03 = 6.76 states/nm3), (e) frontier-OMOs dominantly located in the NH2-terminated NWire section (ρMO = 3 × 10−3 states/a03 = 20.3 states/nm3). A slight distortion of atomic positions occurs at the OH-terminated end due to electrostatic forces, leading to a minor location of MOs

A scanning probe microscopy study of nanostructured TiO₂/poly(3-hexylthiophene) hybrid heterojunctions for photovoltaic applications

• Laurie Letertre,
• Roland Roche,
• Olivier Douhéret,
• Hailu G. Kassa,
• Denis Mariolle,
• Nicolas Chevalier,
• Łukasz Borowik,
• Philippe Dumas,
• Benjamin Grévin,
• Roberto Lazzaroni and
• Philippe Leclère

Beilstein J. Nanotechnol. 2018, 9, 2087–2096, doi:10.3762/bjnano.9.197

• electrostatic forces between the tip and the sample, due to the excess positive charges present in the P3HT layer, i.e., the bond dipole. Upon illumination, it is expected that P3HT-COOH absorbs the incident photons, thus creating excitons. The length of the P3HT-COOH chains being sufficiently small

• compensated in the KPFM measurement to nullify the tip–sample electrostatic forces. This compensation is denoted ΔVlight in Figure 4, and the Vcpd value upon illumination, Vcpd light, is now expressed as: This provides the following expression for the photovoltage: ΔVlight is a positive quantity because the

Recent highlights in nanoscale and mesoscale friction

• Andrea Vanossi,
• Dirk Dietzel,
• Andre Schirmeisen,
• Ernst Meyer,
• Rémy Pawlak,
• Thilo Glatzel,
• Marcin Kisiel,
• Shigeki Kawai and
• Nicola Manini

Beilstein J. Nanotechnol. 2018, 9, 1995–2014, doi:10.3762/bjnano.9.190

• the bond-length and bond-angle variations of the porphyrin leg while sliding. Controlling friction and wear by the application of mechanical oscillations and electrostatic forces One way to control friction is to apply an AC voltage between the probing tip and surface [179]. In this experiment, an